A Curved-Double Slit Producing Both Arc-Interference Pattern Near Curved-Double Slit, and Point-Symmetry Interference Pattern Near Detector in Same Experiment

The interference and the diffraction are two basic phenomena in physical optics. It has been shown that: in the experiment of a double slit, the patterns depend on the shape of the double slit, e.g., a non-parallel double slit produces the hybrid pattern, the interference pattern embedded in the diffraction pattern; a curved double slit produces Point-Symmetry-Interference-Patterns. In this paper, we show for the first time the pattern evolution of a curved double slit experiment: near the curved double slit, the pattern is Pre-Particle pattern (at L = 10 mm), then evolve sequentially to Particle pattern (at L = 60 mm), to Transition pattern-1 (at L = 130 mm), to Arc-interference-pattern (at L = 200 mm), to Transition pattern-2 (at L = 400 mm), and finally, to Point-Symmetry-interference-pattern (at L = 900 mm) which has the point symmetry. We interpret Arc-interference-pattern (at L = 200 mm) in Section 3, and show the curvature dependence of Point-symmetry interference patterns. It is challenge to interpret Point-Symmetry-interference-pattern (at L = 900 mm), and to interpret pattern evolution.