Optica Open
Browse
arXiv.svg (5.58 kB)

Defocused travelling-fringes in scanning triple-Laue x-ray interferometry

Download (5.58 kB)
preprint
posted on 2023-01-11, 22:31 authored by Carlo P. Sasso, Giovanni Mana, Enrico Massa
The measurement of the silicon lattice parameter by a separate-crystal triple-Laue x-ray interferometer is a key step for the kilogram realisation by counting atoms. Since the measurement accuracy is approaching nine significant digits, a reliable model of the interferometer operation is demanded to quantify or exclude systematic errors. This paper investigates both analytically and experimentally the effect of defocus (a difference between the splitter-to-mirror distance on the one hand and the analyser-to-mirror one on the other) on the phase of the interference fringes and the measurement of the lattice parameter.

History

Disclaimer

This arXiv metadata record was not reviewed or approved by, nor does it necessarily express or reflect the policies or opinions of, arXiv.

Usage metrics

    Categories

    Licence

    Exports

    RefWorks
    BibTeX
    Ref. manager
    Endnote
    DataCite
    NLM
    DC