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Depth-resolved Laue microdiffraction with coded-apertures
preprintposted on 2023-01-12, 15:13 authored by Doga Gursoy, Dina Sheyfer, Michael Wojcik, Wenjun Liu, Jonathan Z. Tischler
We introduce a rapid data acquisition and reconstruction method to image the crystalline structure of materials and associated strain and orientations at micrometer resolution using Laue diffraction. Our method relies on scanning a coded-aperture across the diffracted x-ray beams from a broadband illumination, and a reconstruction algorithm to resolve Laue microdiffraction patterns as a function of depth along the incident illumination path. This method provides a rapid access to full diffraction information at sub-micrometer volume elements in bulk materials. Here we present the theory as well as the experimental validation of this imaging approach.