Determining the refractive index, absolute thickness and local slope of
a thin transparent film using multi-wavelength and multi-incident-angle
interference
posted on 2023-11-30, 19:50authored byMengfei He, Sidney R. Nagel
We describe a high-speed interferometric method, using multiple angles of incidence and multiple wavelengths, to measure the absolute thickness, tilt, the local angle between the surfaces, and the refractive index of a fluctuating transparent wedge. The method is well suited for biological, fluid and industrial applications.
History
Disclaimer
This arXiv metadata record was not reviewed or approved by, nor does it necessarily express or reflect the policies or opinions of, arXiv.