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High-precision infrared emissivity measurement and temperature inversion method

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Version 2 2024-05-11, 05:20
Version 1 2024-05-10, 10:20
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posted on 2024-05-11, 05:20 authored by Gangquan Wang, Yinxue Bai, Yue Liu, Longfei Li, Kaihua Zhang, Baolin Zhao, Yufang Liu, Kun Yu
The application potential of thermal radiation measurements in energy harvesting, infrared stealth, and radiative cooling has stimulated renewed research interest in this domain. However, the precise measurement of thermal radiation in laboratory settings encounters challenges stemming from the emission of thermal radiation by optical components and the surrounding environment. In this study, a measurement method was devised to segregate the backgrounds of optical components and sample signal, thereby facilitating accurate measurement of the infrared spectral emissivity of samples at room temperature and higher. Calibration of sample measurement temperatures was accomplished through the fitting of measured spectra of sample with Planck theoretical spectra. To validate the measurement method, a Pt/Cr/Si emitter was conceived and fabricated. The spectral emissivity of the sample, as measured, exhibited commendable concordance with simulation results, underscoring the efficacy of the measurement approach.

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Funder Name

National Natural Science Foundation of China (62075058); Innovation Scientists and Technicians Troop Construction Projects of Henan Province (22400051007); Natural Science Foundation of Henan Province (222300420011,222300420209); Henan Province University Innovation Talents Support Program (23IRTSTHN013)

Preprint ID

112758

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