Optica Open
Browse
arXiv.svg (5.58 kB)

Optical reflection signature of an axion dielectric with magnetic current

Download (5.58 kB)
Version 2 2024-07-12, 16:00
Version 1 2024-07-10, 16:01
preprint
posted on 2024-07-12, 16:00 authored by Pedro D. S. Silva, Ronald A. Pereira, Manoel M. Ferreira
In this work, we investigate the reflection properties on the interface between an ordinary dielectric medium and a dielectric supporting a magnetic current (equivalent to a dielectric governed by axion electrodynamics). Considering the usual Maxwell equations and constitutive relations, we derive the general Fresnel coefficients for reflection for an incident wave with $s$ and $p$ polarization, assuming an isotropic magnetic current on a dielectric substrate. We determine all total internal reflection and critical angles (Brewster angles) conditions, which are given by strict relations between all relevant electromagnetic quantities of the system and the frequency. For $s$- and $p$-polarized incident waves, total internal reflection can occur under certain conditions on the constitutive parameters (for each propagating mode) at specific frequency windows and certain incidence angle intervals. All possible conditions to define critical angles for null reflection are determined. This scenario allows polarization changes by reflection. Considering a $p$-polarized incident wave, the frequency and the Brewster angle, allowing null reflection for both propagating modes, are determined. The Goos-H\"anchen shift and the complex Kerr rotation are also evaluated. The Kerr ellipticity angle presents a frequency-dependent behavior, also reported in Weyl semimetals, having maximum values $\eta_{Kerr}=\pm \pi/4$ for specific values of frequency, which may work as a signature of this axion chiral dielectric.

History

Disclaimer

This arXiv metadata record was not reviewed or approved by, nor does it necessarily express or reflect the policies or opinions of, arXiv.

Usage metrics

    Categories

    Licence

    Exports

    RefWorks
    BibTeX
    Ref. manager
    Endnote
    DataCite
    NLM
    DC