Plasmonic Electro-Optic Modulators based on Epsilon-Near-Zero Materials: Comparing the Classical Drift-Diffusion and Schr\"odinger-Poisson Coupling Models

We present the design, modeling, and optimization of high-performance plasmonic electro-optic modulators leveraging voltage-gated carrier density in indium tin oxide (ITO) where the gated carrier density is modeled using both the Classical Drift-Diffusion (CDD) and Schr\"odinger-Poisson Coupling (SPC) methods. The latter ensures a more detailed and precise description of carrier distributions under various gate voltages which gains particular significance when applied to an epsilon-near-zero (ENZ) medium such as ITO. Combining the nanoscale confinement and field enhancement enabled by surface plasmon polaritons with the ENZ effect in ITO, modulator designs integrated with silicon waveguides and optimized for operation at {\lambda}0 = 1550 nm achieve a 3-dB bandwidth of 210 GHz, an insertion loss of 3 dB, and an extinction ratio of 5 dB for an overall length of < 4 {\mu}m as predicted by the SPC model. Our results illustrate trade-offs between high-speed modulator operation and low insertion loss, vs. extinction ratio, and the need for precise modelling of carrier distributions in ENZ materials.