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Speckle Tracking Phase Contrast Computed Tomography at an Inverse Compton X-ray Source

preprint
posted on 2024-05-07, 03:31 authored by Simon Zandarco, Benedikt Günther, Mirko Riedel, Greogr Breitenhuber, Miriam Kirst, Klaus Achterhold, Franz Pfeiffer, Julia Herzen
Speckle-based X-ray imaging (SBI) is a phase-contrast method developed at and for highly coherent X-ray sources, such as synchrotrons, to increase the contrast of weakly absorbing objects. Consequently, it complements the conventional attenuation-based X-ray imaging. Meanwhile, attempts to establish SBI at less coherent laboratory sources have been performed, ranging from liquid metal-jet X-ray sources to microfocus X-ray tubes. However, their lack of coherence results in interference fringes not being resolved. Therefore, algorithms were developed which neglect the interference effects. Here, we demonstrate phase-contrast computed tomography employing SBI in a laboratory-setting with an inverse Compton X-ray source. In this context, we investigate and compare also the performance of the at synchrotron conventionally used phase-retrieval algorithms for SBI, unified modulated pattern analysis (UMPA) with a phase-retrieval method developed for low coherent systems (LCS). We successfully retrieve a full computed tomography in a phantom as well as in biological specimens, such as larvae of the greater wax moth (Galleria Mellonella), a model system for studies of pathogens and infections. In this context, we additionally demonstrate quantitative phase-contrast computed tomography using SBI at a low coherent set-up.

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Funder Name

Deutsche Forschungsgemeinschaft (Research Training Group GRK 2274,Gottfried Wilhelm Leibniz program); Centre for Advanced Laser Applications

Preprint ID

112711

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