Optica Open
Browse
arXiv.svg (5.58 kB)

THz nanofocusing with cantilevered THz-resonant antenna tips

Download (5.58 kB)
preprint
posted on 2023-11-30, 05:38 authored by S. Mastel, M. Lundeberg, P. Alonso-Gonzalez, Y. Gao, K. Watanabe, T. Taniguchi, J. Hone, F. Koppens, A. Nikitin, R. Hillenbrand
We developed THz-resonant scanning probe tips, yielding strongly enhanced and nanoscale confined THz near fields at their tip apex. The tips with length in the order of the THz wavelength ({\lambda} = 96.5 {\mu}m) were fabricated by focused ion beam (FIB) machining and attached to standard atomic force microscopy (AFM) cantilevers. Measurements of the near-field intensity at the very tip apex (25 nm radius) as a function of tip length, via graphene-based (thermoelectric) near-field detection, indicate their first and second order geometrical antenna resonances for tip length of 33 and 78 {\mu}m, respectively. On resonance, we find that the near-field intensity is enhanced by one order of magnitude compared to tips of 17 {\mu}m length (standard AFM tip length), which is corroborated by numerical simulations that further predict remarkable intensity enhancements of about 107 relative to the incident field. Because of the strong field enhancement and standard AFM operation of our tips, we envision manifold and straightforward future application in scattering-type THz near-field nanoscopy and THz photocurrent nanoimaging, nanoscale nonlinear THz imaging, or nanoscale control and manipulation of matter employing ultrastrong and ultrashort THz pulses.

History

Disclaimer

This arXiv metadata record was not reviewed or approved by, nor does it necessarily express or reflect the policies or opinions of, arXiv.

Usage metrics

    Categories

    Licence

    Exports

    RefWorks
    BibTeX
    Ref. manager
    Endnote
    DataCite
    NLM
    DC