posted on 2023-01-23, 13:04authored byStan ter Huurne, Niels van Hoof, Jaime Rivas
Time-resolved terahertz (THz) spectroscopy has been shown as a powerful technique to non-invasively determine the charge carrier properties in photo-excited semiconductors. However, the long wavelengths of terahertz radiation reduces the applicability of this technique to large samples. Using THz near-field microscopy, we show THz measurements of the lifetime of 2D-single exfoliated microcrystals of transition metal dichalcogenides (WS₂). The increased spatial resolution of THz near-field microscopy allows spatial mapping of the evolution of the carrier lifetime, revealing Auger assisted surface defect recombination as the dominant recombination channel. THz near-field microscopy allows for the non-invasive and high resolution investigation of material properties of 2D semiconductors relevant for nanoelectronic and optoelectronic applications.
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Nederlandse Organisatie voor Wetenschappelijk Onderzoek (Vici 680-47-628)